International Journal

  • 2015

  • 1

    "High Sensitive, Direct, and Label-Free Technique for Hg2+ Detection by Using Kelvin Probe Force Microscopy"

    C. Park, K. Jang, S. Lee, J. You, S. Lee, H. Ha, K. Yun, J. Kim, Howon Lee, J. Park, S. Na*
    Nanotechnology , 26 , 305501 (2015)

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